Measurement of the Nonlinear Refractive Index of Some Silicon Nanostructures Using Reflection Intensity Scan Method
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چکیده
In this paper, we study the magnitude and the sign of optical refractive index of Si nanostructures (nanoporous silicon and 1D periodic silicon-on-insulator nanostructures) using the reflection intensity scan method, which was developed in our laboratory. Our experimental results were reproducible and in good agreement with theoretical predictions, proving the efficiency of this method in the characterization of nonlinear properties of inhomogeneous media and of small areas containing patterns of microand nano-structures.
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تاریخ انتشار 2013